11 апреля 2012 г. состоится бесплатный вебинар фирмы Bruker AFM Enhancing Traditional Electron Microscopy Applications
This webinar takes a look at recent AFM technical advances that provide a highly productive nano-imaging workflow, akin to current electron-microscopy based techniques. Improvements in speed, productivity/usability, and materials characterization are opening new possibilities for research topics, samples, and work environments. We will review and compare a range of applications where the AFM offers either complementary information, or a potentially easier path to research results.
Atomic Force Microscopy (AFM) has traditionally been limited to specialty applications where its capability to provide unique information outweighed its relatively slow speed and difficult operation.
The latest generation of AFM combines highest resolution scans in a fraction of a minute, self-optimizing imaging at nm-resolution, a large, fully automatable sample stage for multiple samples and easy access, and an intuitive, workflow-oriented user interface, to overcome these limitations. They:
- work with native, sectioned, stained, and all common EM sample preps
- enable nanoscale imaging of dynamic changes over time,
- provide true nano-metrological information in all three sample dimensions,
- map quantitative mechanical properties (modulus, adhesion, dissipation) with nm resolution, on materials down to 1MPa, providing material contrast for typical “light element” materials
Please join us for an exciting webinar about the possibilities of current AFMs on traditional Scanning and Transmission Electron Microscopy topics.
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